ばらつき

WO2014143955(特表2016-516658)
(Ab)
"The present disclosure is directed to an apparatus and method for forming sapphire ribbons via Edge-Defined Film-Fed Growth (EFG). Further, the present disclosure is directed to a plurality of concurrently grown sapphire ribbons having features such as a low dimensional variability（寸法ばらつき）and elimination of voiding between the sapphire ribbons concurrently grown in a batch."

US8859058(特表2014-503458)
"1. A method of manufacturing synthetic diamond material via chemical vapour deposition, the method comprising:

...

having an E_z electric field variation（電場ばらつき）of no more than ±10% of a central E_z electric field strength, the ring of higher electric field being disposed around the central portion and having a peak E_z electric field strength in a range 10% to 50% higher than the central E_z electric field strength."

WO2011085146(特表2013-516744)
"8. The directional lamp as set forth in claim 7, wherein the one or more LED devices include LED devices of at least two different colors, and the light mixing diffuser is effective to reduce the variation of chromaticity（色度のばらつき）within the FWHM beam angle to within 0.006 from the weighted average point on the CIE 1976 uV color space diagram."

"10. The directional lamp as set forth in claim 9, wherein:
the light source is positioned along the optical axis of the beam forming optical system at a defocused position respective to the lens to produce defocusing, and
diffusion of the light beam provided by the light mixing diffuser together with the defocusing transforms a spatial intensity distribution of the light beam having multiple intensity peaks due to the plurality of spatially discrete light emitting elements into a light beam having no visually perceptible local variations of intensity（強度のばらつき）throughout the beam pattern."

US7688456(特表2006-510912)
(Ab)
"Methods and related program product for assessing and optimizing metrology instruments by determining a total measurement uncertainty (TMU) based on precision and accuracy. The TMU is calculated based on a linear regression analysis and removing a reference measuring system uncertainty (U_RMS) from a net residual error. The TMU provides an objective and more accurate representation of whether a measurement system under test has an ability to sense true product variation（製品のばらつき）."

WO2006062851(特表2008-522873)
(Ab)
"Variations（ばらつき）in extrusion speed or flowfront shape across the outlet faces of honeycomb extrusion dies are predicted from variations（ばらつき）in die geometry across multiple die extrusion zones, based on data correlating the variables to the variations in extrusion speed or flowfront shape, or on calculations of the pressure drops to be experienced by extrudable materials traversing the extrusion zones, adjusting the variations through die processing as desired to appropriately modify die geometry prior to use of the die in an extruder."