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可変

2016-11-15 18:48:44 | 英語特許散策

WO2014159491 (A2)
Claim 29: "...a voltage varying arrangement(電圧可変装置)for receiving the power source operating voltage from the power source, transforming the operating voltage, and outputting a variable drive voltage that may be applied to the electric motor and that is independent of the power source operating voltage"

US20150345413
(Abstract)
"A supercharging arrangement for an internal combustion engine. The supercharging arrangement comprises a supercharger having a rotational drive input, and a transmission having a rotational drive input to receive drive from an internal combustion engine, and a rotational drive output connected to the input of the supercharger. The transmission includes a variator(可変装置)operatively connected(動作可能に結合)between the input and the output of the transmission, which variator has an output(出力部)that is driven at an operating ratio from an input(入力部). A control system operates to cause an engine to deliver an amount of torque that is indicated by the state of an input to the control system. The control system is further operative to set(設定するよう動作)the operating ratio of the variator."

US6619308
(Abstract)
"A variable device(可変装置)for regulating the outlet pressure of a fluid from a valve body, includes a pressure-sensing chamber having a wall formed by a resilient self-restoring diaphragm which is responsive to pressure(*無冠詞)in the chamber. A valve element connected to the diaphragm controls flow(*無冠詞)into the chamber. Increased pressure(*無冠詞)in the chamber decreases the flow into the chamber and decreasing pressure increases flow whereby fluid flow(*無冠詞)out from the chamber is maintained at a desired pressure(*不定冠詞). The outlet pressure is adjusted by deflecting the diaphragm in a direction to open the valve while permitting a section of the diaphragm connected to the valve member to remain responsive to the pressure(*定冠詞)in the chamber. An adjustment cover is provided to adjustably deflect the diaphragm and includes a catch mechanism to allow adjustment of the fluid outlet pressures and also retain the device at a desired value. An indicator arrangement may be provided to visually indicate the fluid outlet pressure."

US8651086
(Abstract)
"An internal combustion engine is provided. Facing pistons eliminate a cylinder head, thereby reducing heat losses through a cylinder head. Facing pistons also halve the stroke that would be required for one piston to provide the same compression ratio, and the engine can thus be run at higher revolutions per minute and produce more power. An internal sleeve valve is provided for space and other considerations. A combustion chamber size-varying mechanism(燃焼室容積可変機構)allows for adjustment of the minimum size of an internal volume to increase efficiency at partial-power operation. Variable intake valve operation is used to control engine power."

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目開き

2016-11-05 12:15:10 | 米国特許散策

US9133111
"Calculate the weight percentage of the test specimen retained(保持)on each sieve.  Express the weight percentage passing through each sieve, and cumulated(累加).  Determine by graphical interpolation the mesh opening(メッシュの目開き)equivalent to the 90% and 99.5% cumulated weight percentage (D90, D99.5)."

US8076530(JP)
"Classification at a time of measuring mass average particle diameter (D50) and logarithmic standard deviation (σξ) of particle diameter distribution is performed as follows: 10.0 g of water-absorbing resin particles or a primary water-absorbing agent is put in the JIS standard sieves (IIDA TESTING SIEVE: diameter 8 cm) with mesh openings(目開き)being 850 μm, 710 μm, 600 μm, 500 μm, 425 μm, 300 μm, 212 μm, 150 μm, 45 μm etc., and is classified for 5 minutes by a vibrating classifier (IIDA SIEVE SHAKER, TYPE: ES-65 (rotational frequency: 60 Hz 230 rpm, number of concussion: 60 Hz 130 rpm), SER. No. 0501) under conditions that the temperature is a room temperature (23±2° C.) and humidity is 50RH %."

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昇降

2016-11-04 17:52:46 | 米国特許散策

WO2006020631
(Abstract)

"An apparatus (10) for contactless measurement of sheet charge density and mobility includes a microwave source (16), a circular waveguide (50) for transmitting microwave power to a sample (59), such as a semiconductor wafer or panel for flat panel displays, at a measurement location, a first detector (18) for detecting the forward microwave power, a second detector (23) for detecting the microwave power reflected from the sample, and a third detector (95) for detecting the Hall effect power. An automatic positioning subsystem (700) is also provided for allowing automatic positioning of a wafer (59) within the test apparatus (10). The positioning system (700) includes a first end effector (706) and a rotator-lifter(回転/昇降器)(704). The first end effector (706) can grasp a sheet element (59) and move it to a desired position within the test apparatus (10), while the rotator lifter (704) provides incremental adjustment of a theta angle of the sheet element (59) to allow automated mapping of an entire sheet element without the need for(要することなく)manual adjustment of the position of the sheet element. A second end effector (716) can be mounted opposite(対向)the first end effector (706) and can be used to automatically position the sheet element (59) within a sheet resistance testing module (718) located at an opposite end of the apparatus (10)."

US9236305
(Abstract)
"Laser and plasma etch wafer dicing where(便利なwhere) a mask is formed covering(~するように、~して形成) ICs formed on the wafer, as well as any bumps providing an interface to the ICs. The semiconductor wafer is coupled to a film frame by an adhesive film. The mask is patterned by laser scribing to provide a patterned mask with gaps. The laser scribing exposes regions of the semiconductor wafer, below thin film layers from which the ICs are formed. The semiconductor wafer is plasma etched through the gaps in the patterned mask while the film frame is maintained at an acceptably low temperature with a chamber shield ring configured to(~するように構成された状態で) sit beyond the wafer edge and cover the frame. The shield ring may be raised and lowered(昇降), for example, on lifter pins to facilitate transfer of the wafer on frame."

US9108322
(Abstract)
"A system and method for monitoring forces on a substrate lifting apparatus(昇降装置). The system includes a platen cartridge with a platen and a movable lifting(昇降)portion. The movable lifting portion includes a plurality of lifting arms coupled to a plurality of lift(昇降)pins. A plurality of force sensing elements are associated with (対応)respective ones of the plurality of lifting arms and the plurality of lift pins. A controller receives signals from the plurality of force sensing elements, correlates the signals to respective forces applied to said plurality of lift pins. The correlated forces may indicate to the controller that an error condition exists, such as a stuck wafer, a broken wafer, a mis-positioned wafer, or a mechanical malfunction."

US20090233449
"2. The etching system of claim 1, further including means for lowering and lifting(昇降)the semiconductor wafer or sample to and from the sample holder.

US2015027917
Abstract
"A pallet system (50 b) is formed from a pallet (10) and a plurality of panels (54 a, 54 b, 54 c, 54 t and 56). The pallet (10) has a base (12) configured to receive members of a lifting apparatus to enable lifting(昇降)of the pallet (10). The panels (54 a, 54 b, 54 c, 54 t and 56) are coupled to each other and the pallet (10) to enable the panels to be moved between a closed configuration and an open configuration. In the closed configuration the panels can surround and contain one or more articles on the pallet (10). In the open configuration one of the panels is positioned to provide an opening to enable transfer of an article through the opening onto or off of the pallet (10) in a direction substantially parallel to a plane of the pallet (10)."

"[0084] When it is desired to load articles onto or unload articles from the pallet system 50 the panel 56 can be moved by decoupling it from the sleeves 62 to thereby create the opening 60 and reconnected or engaged with the panel 54b by locating the fingers 66 in the sleeves 64. This can be performed by lifting(上昇)then lowering(下降)of the panel 56 relative to the other panels 54 in a plane of the panels."

US7636966
"15. A docking station for use with a hospital bed having a base frame, a set of casters coupled to the base frame, and a patient support deck supported above the base frame, the docking station comprising: a column, a docking port coupled to the column and coupleable to(結合可能)the hospital bed the docking port being configured(構成)for delivery of at least one of(少なくとも1つの)a video service, an audio service, a data service, a communication service, a power service, a medical gas service, a vacuum service, a hydraulic service, or (選択肢のor)a pressurized air service to the hospital bed through the base frame while the casters of the base frame of the hospital bed remain supported by an underlying floor, and a patient table coupled to the column above the docking port.

16. The docking station of claim 15, wherein the patient table is raisable and lowerable(昇降可能)relative to the column."

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光取出し効率、光取り出し効率、光取出効率

2016-11-03 22:24:06 | 米国特許散策

US8766296(中村修二氏の発明)
"1. A (B, Al, Ga, In)N light emitting diode (LED), comprised of: at least an n-type layer, an emitting layer, and a p-type layer; wherein light from the emitting layer is extracted(取り出す)through a nitrogen face (N-face) surface of the LED and the N-face surface of the LED is comprised of structures that increase extraction efficiency of the light(光取出し効率)out of the N-face surface of the LED; wherein the structures comprise a plurality of etched cones; and wherein the etched cones have a size not smaller than a wavelength of the light extracted from the N-face surface."

US8659221
(Abstract)
"A light extraction(抽出)film having multi-periodic zones of engineered(人工)nanostructures. The light extraction film includes a flexible substrate, a layer of low index engineered nanostructures applied to the substrate, and a high index backfill layer applied over the nanostructures. The multi-periodic zones include a repeating zone of the nanostructures having multi-periodic characteristics. The repeating zone includes first and second sets of nanostructures having different periodic pitches(周期ピッチ). The multi-periodic zones can be used to enhance(高める)the light output and tune the angular luminosity of organic light emitting diode devices."

"In OLED devices, over 70% of the generated light is typically lost due to processes within the device structure. The trapping of light at the interfaces between the higher index organic and Indium Tin Oxide (ITO) layers and the lower index substrate layers is the major cause of this poor extraction efficiency(抽出効率). Only a relatively small amount of the emitted light emerges(現れる)through the transparent electrode as "useful" light. The majority of the light undergoes internal reflections(内部反射される), resulting in light being emitted from the edge of the device or trapped within the device and eventually being lost to absorption within the device after making repeated passes.

Light extraction films use internal nanostructures to avoid waveguiding losses within the device. While providing strong light extraction(光の取出し), internal nanostructures, comprising regular features such as photonic crystals or linear gratings, tend to produce diffraction-related variations in the angular and spectral distributions of the emitted light, which may not be desirable in final applications. Thus, a need exists for(必要性が存在)a light extraction film that simultaneously enhances the efficiency of light extraction(光取出し効率)via the nanostructures, while also reducing undesirable luminance and color angular non-uniformity in the light output."

US8188486
(Abstract)
"An optical disk for use in converting light emitted from a light-emitting diode chip to white light.(名詞句)The optical disk includes a tapered surface such that a center area of the disk has a width greater than a width of an outer area of the disk. The optical disk is formed of a silicone having at least one weight percent mix of phosphor. Various embodiments of this generally described optical disk are also presented."

"Such a lighting module combines the thermal advantages of chip-on-board (COB) LED construction with the enhanced light extraction(光取出し効率)of packaged discrete LED construction to form a 2D LED array lighting module."

US7677733
(Abstract)
"A method of designing a backlight light guide for an autostereoscopic(自動立体)3D display includes specifying a backlight having a light guide thickness and extractor angle and a light transmission surface having a predetermined width value and a predetermined length value. Then, the method includes selecting a plurality of design parameter value pairs, where each parameter value pairs includes a light guide thickness value and a prism angle value, and each design parameter value pair is different from each other. Then the method includes executing an ray tracing optical model on the light guide for each parameter value pair to calculate output data for each parameter value pair, the output data including a single pass light extraction efficiency(光取出し効率)value, an average minimum light angle value emitted from the second surface, and a maximum flux/minimum flux value emitted from the second surface; and selecting a parameter value pair based on the output data to manufacture the light guide for an autostereoscopic 3D display."

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