EP1917687
"1. A semiconductor laser device, comprising:
a substrate;
an epitaxially grown layer structure on said substrate;
a laser cavity of length lc formed in said epitaxially grown layer, said laser cavity having at least one etched facet surface(ファセット面)perpendicular to the substrate plane;
a chip of length ls produced from said substrate by singulation(個片化)and incorporating said laser cavity, with ls being greater than said laser cavity length lc;
said chip having a distance h from the center(中心;*定冠詞)of a beam axis of said laser cavity to an etched top surface of said chip and a distance a from the edge of said chip to the said etched facet;
said laser cavity being capable of producing a laser output beam with a full-width-half-maximum(半値全幅)vertical far-field angle(垂直遠視野角)-; and
wherein the ratio h/a that is equal or greater than(等しいか、または大きい)
[mathematical formula - see original document]"
WO2009138760
"5. A device according to any preceding claim wherein the pore has a conical, tapered, cylindrical, picture frame(額縁状;*額縁形), etch pit of [111] facets(ファセット面)in a [100] face(*結晶面)of the diamond thin film substrate, or hemispherical geometry."
WO2007098215
"1. A device, comprising:
(a) one or more oblique or facetted surfaces(ファセット面)of a substrate or template."
WO2007025032
"1. A semiconductor laser device, comprising: a substrate; an epitaxially grown layer structure on said substrate; a laser cavity of length /c formed in said epitaxially grown layer, said laser cavity having at least one etched facet surface(ファセット面)perpendicular to the substrate plane; a chip of length /s produced from said substrate by singulation and incorporating said laser cavity, with ls being greater than said laser cavity length /c; said chip having a distance h from the center of a beam axis of said laser cavity to an etched top surface of said chip and a distance a from the edge of said chip to the said etched facet; said laser cavity being capable of producing a laser output beam with a full-width-half-maximum vertical far-field angle &[deg.]; and wherein the ratio h/a that is equal or greater than
Image available on "Original document""
WO9411930
"5. A method of fabricating a device structure from a starting wafer(素材ウエーハ)having a heterostructure material grown on a substrate, comprising the steps of: masking the wafer with a first mask pattern having exposure windows corresponding to device regions of said wafer; controllably etching through(蝕刻)the exposed device regions of said wafer, patterned by the first mask pattern, to define a ridge waveguide area(うね形導波領域)and a fiber-receiving area; masking the wafer with a second mask pattern having exposure windows corresponding to areas for forming facet surfaces(ファセット面)in said ridge waveguide area; controllably etching through the exposed regions of said wafer, patterned by the second mask pattern, to define a lasing region(レーザ部)and a detection region; masking the wafer with a third mask pattern having an exposure window corresponding to said fiber-receiving area; and controllably etching through the exposed regions of said wafer, patterned by the third mask pattern, to define a fiber-receiving channel(受容溝)in said wafer."