HDD信頼性メモ 1：Jon G. Elerath, Network Appliance Inc.

HDDの信頼性を調べていたら、The Annual Reliability & Maintainability Symposium (RAMS) で
1994年から精力的に発表されている HDDに関しての信頼性工学の専門家を発見：

The Annual Reliability & Maintainability Symposium (RAMS)
　http://www.rams.org/
Proceedings of the Annual Reliability and Maintainability Symposium (RAMS)
　http://ieeexplore.ieee.org/servlet/opac?punumber=1000626


Jon G. Elerath, Network Applicance Inc.,
　Education:
　　B.S.M.E. University of Arizona
　　M.S.M.E. University of Arizona (Reliability)
　Experience:
　　GE - Safety Systems for Fast Breeder Reactoras
　　Tegel (Motorola) - Plasma Etching Equipment
　　Tandem/Compaq - Fault Tolerant Computers
　　IBM - Disk Drives
　　Network Appliance - Storage Systems

"A Comparison of Predicted MTBFs to Field and Test Data",
　Wood, A.P.and Elerath, J.G., Tandem Comput. Inc.,
　Reliability and Maintainability Symposium, 1994. Proceedings., Annual
　　http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=7209&arnumber=291099&count=84&index=27
　　HDDの信頼性についての論文・発表等で数多く引用されるもの
" Reliability Management and Engineering in a Commercial Computer environment",
　Elerath, J.G., Wood, A.P., Christiansen, D., and Hurst-Hopf, M., IBM Corp.,
　Reliability and Maintainability Symposium, 1999. Proceedings., Annual
　　http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=16055&arnumber=744139&count=72&index=55
" Specifying Reliability in the Disk Drive Industry: No More MTBF's"
　Elerath, J.G., IBM Corp.,
　Reliability and Maintainability Symposium, 2000. Proceedings., Annual
　　http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=17683&arnumber=816306&count=70&index=33
　　HDDの信頼性、特に MTBF (平均故障間隔：Mean Time Between Failures) についての論文・発表等で
　　ほぼ確実に引用されるもの
"AFR: Problems of Definition, Calculation and Measurement in Acommercial Environment",
　Elerath, J.G., IBM Corp.,
　Reliability and Maintainability Symposium, 2000. Proceedings., Annual
　　http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=17683&arnumber=816286&count=70&index=13
　　AFR (年間故障率：Annualized Failure Rate) について
"Implied service Strategies in Availability Assessments",
　Elerath, J.G., Network Appliance, Inc,
　Reliability and Maintainability Symposium, 2003. Proceedings., Annual
　　http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=26531&arnumber=1181908&count=102&index=15
"Disk Drive Reliability Case Study: Dependence Upon Head Fly-height and Quantity of Heads",
　Elerath, J.G. and Shah, S., Network Appliance, Inc.,
　Reliability and Maintainability Symposium, 2003. Proceedings., Annual
　　http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=26531&arnumber=1182057&count=102&index=99
"Server Class Disk Drives: How Reliable are They?
　Elerath, J.G. and Shah, S., Network Applicance Inc.,
　Reliability and Maintainability Symposium, 2004. Proceedings., Annual
　　http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=28680&arnumber=1285439&count=112&index=27
"Disk Drive Vintage and Its Effect on Reliability",
　Shah, S. and Elerath, J.G., Network Appliance Inc.,
　Reliability and Maintainability Symposium, 2004. Proceedings., Annual
　　http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=28680&arnumber=1285441&count=112&index=29
"Reliability Analysis of Disk Drive Failure Mechanisms",
　Shah, S. and Elerath, J.G., Network Appliance Inc.,
　Reliability and Maintainability Symposium, 2005. Proceedings., Annual
　　http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=30517&arnumber=1408366&count=107&index=38
2007年の RAMSでは、Session Modeｒatorを務められています

参考：
"A Comparison of Disk Drives for Enterprise Computing"
　Kurt Chan, Network Appliance Inc.
　;login:, The USENIX Magazine
　June 2006, Volume 31, Number 3
　　http://www.usenix.org/publications/login/2006-06/


The Annual Reliability & Maintainability Symposium (RAMS)で他に気付いた発表：
"A New Method of Hard Disk Drive MTTF Projection using Data from Anearly Life Test",
　Shaohsin Chen, Feng-Biu Sun and Yang, J.J., Quantum Corp.,
　Reliability and Maintainability Symposium, 1999. Proceedings., Annual
　　http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=16055&arnumber=744127&count=72&index=43
"A Comprehensive Review of Hard-disk Drive Reliability",
　Yang, J. and Feng-Bin Sun, Quantum Corp.,
　Reliability and Maintainability Symposium, 1999. Proceedings., Annual
　　http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=16055&arnumber=744151&count=72&index=66
　　こちらも良く引用されていたと思います


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