At present, SoC design for the various types of memory (RAM, ROM, NVM, DRAM, Embedded DRAM) is the growing demand for automotive electronics and networking products, the use of non-volatile memory (Non-Volatile Memory; NVM) the proportion and capacity have been greatly improved. With the demand for automotive electronics and networking products, the quality, reliability and low cost of system chips are daunting challenges for today's system on chip (SoC) designers. ("OnYemand NVM Testing and Repairing Technical"), which is innovated by HOY Technologies, can be used for repetitive and reliable detection and repair of NVMs in chips. The reliability of the chip has been improved the quality and increased product competitiveness.
To the automotive electronic components, the chip factory must have been through the precision memory testing project to ensure the reliability of such chips; to Internet of things related to the chip, this chip emphasizes the price and reliability, At present, most of the Internet of Things will use NVM to reduce costs, but NVM testing must rely on the machine (Automation Test Equipment; ATE) test, and the test time is very long, how to reduce NVM test costs and improve reliability Chip suppliers need to solve the problem.
In the past, if the chip encountered NVM defect problems, the general practice is to use the error correction (ErrorCorrecting Code; ECC) way to achieve memory error checking and correct errors, but considering the cost of implementation, ECC can only achieve a bit (bit) error For example, if the data bit is 8 bits, an additional 5 bits are required for ECC error checking and correction. Each time the data bits are doubled, ECC needs to add a "one-bit" check bit. That is, when the data bit is 16 bits, the ECC bit is 6 bits, the ECC bit is 7 bits at 32 bits, the 8 bits when the data bit is 64 bits, and so on. If you want to be precise correction, in the realization of ECC need to take up a large Gate Count, want to "more" bit correction, the design cost considerations, is not easy to achieve. Such as how to use ds18b20 and how to program nrf51822.
With Ontec's "On-Demand NVM Testing and Repairing Technical", you can complete the repair of the entire page under the most streamlined Gate Count, and the entire NVM detection time can be significantly reduced , Because the chip in the factory before the test process, ATE only need to send a start signal to the real-time non-volatile memory test and repair silicon intellectual property, real-time non-volatile memory test and repair silicon intellectual money will use the chip internal clock (Clock) for NVM detection and repair. In addition, when the chip in the "use" NVM defects when the real-time non-volatile memory test and repair silicon intelligence can also be through the MCU / CPU to drive NVM detection and repair, to achieve real-time repair effect.